JPH0422283Y2 - - Google Patents
Info
- Publication number
- JPH0422283Y2 JPH0422283Y2 JP19924782U JP19924782U JPH0422283Y2 JP H0422283 Y2 JPH0422283 Y2 JP H0422283Y2 JP 19924782 U JP19924782 U JP 19924782U JP 19924782 U JP19924782 U JP 19924782U JP H0422283 Y2 JPH0422283 Y2 JP H0422283Y2
- Authority
- JP
- Japan
- Prior art keywords
- sample
- thickness
- film
- thin plate
- rays
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000005259 measurement Methods 0.000 claims description 7
- 230000005855 radiation Effects 0.000 claims description 5
- 239000000463 material Substances 0.000 claims description 4
- 230000007423 decrease Effects 0.000 description 5
- 230000000694 effects Effects 0.000 description 4
- 239000000126 substance Substances 0.000 description 4
- 229910021607 Silver chloride Inorganic materials 0.000 description 3
- HKZLPVFGJNLROG-UHFFFAOYSA-M silver monochloride Chemical compound [Cl-].[Ag+] HKZLPVFGJNLROG-UHFFFAOYSA-M 0.000 description 3
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- 230000005284 excitation Effects 0.000 description 2
- 239000013076 target substance Substances 0.000 description 2
- 238000002083 X-ray spectrum Methods 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 229920013716 polyethylene resin Polymers 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
Landscapes
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP19924782U JPS59103260U (ja) | 1982-12-25 | 1982-12-25 | 放射線応用測定装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP19924782U JPS59103260U (ja) | 1982-12-25 | 1982-12-25 | 放射線応用測定装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS59103260U JPS59103260U (ja) | 1984-07-11 |
JPH0422283Y2 true JPH0422283Y2 (en]) | 1992-05-21 |
Family
ID=30424791
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP19924782U Granted JPS59103260U (ja) | 1982-12-25 | 1982-12-25 | 放射線応用測定装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS59103260U (en]) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6190612B2 (ja) * | 2013-04-05 | 2017-08-30 | 学校法人福岡大学 | フィルム試料サンプリング治具とサンプリング方法 |
-
1982
- 1982-12-25 JP JP19924782U patent/JPS59103260U/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS59103260U (ja) | 1984-07-11 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR19990028265A (ko) | 전반사 형광 x선 분석 장치 및 방법 | |
JPH03505251A (ja) | 基板上の皮膜の厚さと組成を計測するための方法 | |
US2642537A (en) | Apparatus for determining coating thickness | |
JPH02228515A (ja) | コーティング厚さ測定方法 | |
JPH0422283Y2 (en]) | ||
US4350889A (en) | X-Ray fluorescent analysis with matrix compensation | |
JPH0578762B2 (en]) | ||
JPH0228819B2 (ja) | Metsukiekibunsekisochi | |
JPH10221047A (ja) | 蛍光x線膜厚分析装置及び方法 | |
JPH0224545A (ja) | 蛍光x線分析方法 | |
JP3373698B2 (ja) | X線分析方法およびx線分析装置 | |
JP2507934Y2 (ja) | 蛍光x線分析装置 | |
JPH0346325Y2 (en]) | ||
JPS61250508A (ja) | 膜厚測定装置 | |
JP2521607B2 (ja) | 塗膜の付着量の測定方法 | |
SU1375953A1 (ru) | Способ определени шероховатости поверхности | |
JP3386580B2 (ja) | X線分析方法 | |
JPS60133308A (ja) | メツキ被膜付着量測定方法 | |
Eggebraaten et al. | Determination of Micro Rhodium Film Thickness and of Gold Plating Thickness on Printed Circuits by Beta Radiation Backscatter Measurements | |
SU754274A1 (ru) | Способ рентгеноспёктрального флуоресцентного анализа вещества в легком наполнителе 1 | |
JP3195046B2 (ja) | 全反射状態の検出方法および微量元素の測定装置 | |
JPS6333122Y2 (en]) | ||
JPH0251122B2 (en]) | ||
Gupta et al. | Carbon tetrachloride absorption in low‐density polyethylene pellets: Concentration profiles by electron microprobe analysis | |
JP2681974B2 (ja) | X線表面応力測定装置 |